B. Holdford
Texas Instruments
Dallas, TX
Packaging
Yield
|
C. Richardson
Abound Solar
Fort Collins, CO
Focused Ion Beam
Fault Isolation
|
C. Furlong
Worcester Polytechnic Institute, WPI
Worcester, MA
Fault Isolation
Microscopy Tools
|
J. A. Walraven
Sandia National Labs
Albuquerque, NM
MEMS Devices
|
K. S. Wills
Independent Consultant
Sugar Land, TX
FA Basics
Fault Isolation
|
L. G. Henry
ESD-TLP Consulting & Testing
Fremont,, CA
Failure Mechanisms
|
M. Keim
Mentor Graphics
Wilsonville, OR
Test and Logic Diagnostics
|
R. Ring
SMSC Austin
Austin, TX
Device and Memory FA
Emerging Technologies
|
S. Subramanian
Freescale Semiconductor, Inc.
Austin, TX
Materials Characterization
Microscopy Tools
|
S. Li
Spansion Inc
Sunnyvale, CA
Device and Memory FA
|
T. Myers
ON Semiconductor
Gresham, OR
Emerging Technologies
Failure Mechanisms
Lead Free Packaging
|
V. Chowdhury
Altera Corp.
San Jose, CA
EOS/ESD
|
W. E. Vanderlinde
Laboratory for Physical Sciences
College Park, MD
Fault Isolation
Microscopy Tools
|
Z. Wang
Intel Corporation
Chandler, AZ
Test and Logic Diagnostics
Lead Free Packaging
Lab Management
|
