M. A. Nailos, D. Stein, Dell, Inc., Round Rock, TX; L. T. Nielsen, A. Iwasinska, Microanalytics, a MOCON Company, Round Rock, TX

Summary: Identification of odor causing compounds using a specifically-designed-for odor analysis system. The example used in the paper is an off odor on a stamped metal part. The suspected source is a trace level contaminant in a stamping oil used in its manufacture.