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Symposium

Tuesday, November 14, 2006
10:15 AM-11:30 AM
Session 1: Advanced Techniques 1
1:30 PM-2:45 PM
Session 2: System Level Analysis
Session 3: Test and Diagnostics
3:05 PM-4:45 PM
Session 5: Scanning Probe Microscopy
3:05 PM-5:10 PM
Session 4: Circuit Edit and Beam-based Sample Preparation
5:30 PM-7:30 PM
Session 6: Panel Discussion
Wednesday, November 15, 2006
10:20 AM-11:35 AM
Session 7: Package Level Analysis 1
10:20 AM-12:25 PM
Session 8: Discretes, Passives, MEMS, and Optoelectronics
12:25 PM-2:25 PM
Session 9: Posters
3:55 PM-6:00 PM
Session 10: Metrology and Materials Analysis 1
Session 11: Die Level Fault Isolation
Thursday, November 16, 2006
8:00 AM-9:15 AM
Session 13: Chemical and Mechanical Sample Preparation
8:00 AM-9:40 AM
Session 12: Metrology and Materials Analysis 2
9:55 AM-12:00 PM
Session 14: Advanced Techniques 2
Session 15: Yield Analysis
1:20 PM-3:00 PM
Session 16: Optical Fault Isolation
Session 17: Analytical Process
3:15 PM-4:55 PM
Session 18: Package Level Analysis 2
3:15 PM-5:20 PM
Session 19: Nanotechnology and Nanoprobing