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| EOS/ESD | ||||
| Location: Wedgewood Room (Renaissance Austin Hotel) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chair: | Dr. Vijay Chowdhury Altera Corp., San Jose, CA | |||
| 2:45 PM | How Transmission Line Pulse (TLP) ESD Testing is used for ESD Failure Analysis | |||
| 5:00 PM | Electrical Overstress (EOS) in Semiconductor Devices: How to Differentiate and Document EOS due to Over-Current or Over-Voltage Conditions | |||