M. Versen, University of Applied Sciences Rosenheim, Rosenheim, Germany; S. Hoch, Qimonda AG, Neubiberg, Germany
Failure analysis of DRAMs requires an understanding of the functional operation and specific fail behaviours. The seminar explains how electrical failure analysis establishes the basis for a successful physical failure analysis. An introduction to the memory operation is given with a focus on the device response to external commands. Some failure analysis examples for the memory array are presented relating to read and write failures.