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| Location: Meeting Room J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chairs: | Dr. William E. Vanderlinde Laboratory for Physical Sciences, College Park, MD Dr. Sam Subramanian Freescale Semiconductor, Inc., Austin, TX Dr. Cosme Furlong Worcester Polytechnic Institute, WPI, Worcester, MA | |||
| 1:00 PM | Optical and Infrared FA Microscopy | |||
| 2:30 PM | Scanning Electron Microscopy | |||
| 3:45 PM | Break | |||
| 4:00 PM | Transmission Electron Microscopy for Failure Analysis | |||
| 5:00 PM | Advanced Techniques in Sample Preparation and TEM Analysis of Microelectronic Materials | |||
| 5:45 PM | Ultra-High Resolution Scanning Electron Microscopy | |||