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| Fault Isolation | ||||
| Location: Meeting Room J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chairs: | Dr. Cosme Furlong Worcester Polytechnic Institute, WPI, Worcester, MA Mr. Chris Richardson Abound Solar, Fort Collins, CO Dr. William E. Vanderlinde Laboratory for Physical Sciences, College Park, MD Mr. Scott Wills Independent Consultant, Sugar Land, TX | |||
| 8:00 AM | Lock-in Thermography | |||
| 9:30 AM | Break | |||
| 9:45 AM | Flip-Chip and Backside Analysis Techniques | |||
| 10:45 AM | Photonic Localization Techniques | |||
| 12:00 PM | Lunch | |||
| 1:00 PM | The Role of the AFM in Yield and Failure Analysis | |||
| 2:00 PM | The Pivotal Role of AFP Nanoscale Failure Analysis | |||
| 3:00 PM | 2nd Break | |||
| 3:15 PM | Beam-Based Defect Localization Techniques | |||
| 5:00 PM | Fundamentals of Laser Based FA Techniques | |||