|
||||
| Back to "Tutorial" Search | Back to Main Search | |||
| EOS/ESD | ||||
| Location: Meeting Room J3 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chair: | Mr. Jeremy A. Walraven Sandia National Labs, Albuquerque, NM | |||
| 8:00 AM | Electrical Overstress (EOS) in Semiconductor Devices: How to Differentiate and Document EOS due to Over-Current or Over-Voltage Conditions | |||
| 9:30 AM | Break | |||
| 9:45 AM | ESD Testing of Electronic Components using the Transmission Line Pulse Methodology | |||