ISTFA Home   •   Exposition   •   To Register   •   ASM Homepage
Back to "Session 10: Posters" Search
  Back to "Symposium" Search  Back to Main Search

Wednesday, November 5, 2008

Automated Sample Preparation of Packaged Microelectronics for FESEM

R. R. Cerchiara, P. E. Fischione, M. F. Boccabella, A. C. Robins, E.A. Fischione Instruments, Inc., Export, PA

View in PDF format

Summary: Automated sample preparation of packaged devices is done using a combination of mechanical, ion and plasma based techniques.