B. P. Sood, CALCE, University of Maryland, College Park, MD; M. Zagami, Fairchild Controls Corp, Frederick, MD; A. Shrivastava, A. Amin, M. Azarian, M. Pecht, University of Maryland, College Park, MD

Summary: A detailed failure analysis methodology for thick film power resistors subjected to highly accelerated life testing (HALT) is presented in the paper.