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Wednesday, November 5, 2008

High Precision Ion Beam Milling with Time of Flight Compensation

T. Holtermann, M. DiBattista, S. Rosenberg, A. Graupera, FEI Company, Hillsboro, OR

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Summary: For optimal control in circuit edit processing, Time of Flight compensation in the ion column deflection system increases the beam placement accuracy and patterning accuracy in advanced circuit edit applications.