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Tuesday, November 4, 2008 - 5:00 PM

Techniques for identification of silver migration in plastic encapsulated devices assembled with molding compound containing red phosphorus flame retardant material

R. Hylton, Maxim Integrated Products, Hillsboro, OR

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Summary: This paper describes the electrical signatures and the failure analysis techniques used to identify plastic encapsulated devices that have failed because of adjacent pin leakages as a result of silver migration. This migration has been associated with molding compounds that utilize red phosphorous as the flame retardant material.