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| Session 11: System Level Failure Analysis | ||||
| Location: Portland Ballroom 254 (Oregon Convention Center ) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chairs: | Dr. James J. Demarest IBM, Albany, NY Mr. Jeff Hartsell Dell Inc., ROUND ROCK, TX | |||
| 3:00 PM | Dynamic Laser Stimulation technique for device qualification process | |||
| 3:25 PM | Lead frame metal migration in an encapsulated IC package | |||
| 3:50 PM | Latent Flash Single Bit and Multiple Bits Systematic Approach to Failure Analysis | |||
| 4:15 PM | Reliability for Pure CMOS One-time Programmable Memory Using Gate-Oxide Anti-fuse (eFuse) | |||