The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM

Tutorial

Organizers:

C. Rue
FEI Company
Hillsboro, OR
Die and Defect Access
 

D. J. Bodoh
Freescale Semiconductor
Austin, TX
Technology-Specific FA
Fault Isolation
Lab Management
 

J. J. Demarest
IBM
Albany, NY
Fault Isolation
 

J. A. Walraven
Sandia National Labs
Albuquerque, NM
Technology-Specific FA
 

K. (. Hooghan
FEI KAUST
Saudi Arabia
FIB
 

R. Ross
Independent
VT
Technology-Specific FA
 

S. Subramanian
Freescale Semiconductor, Inc.
Austin, TX
The Periphery of FA
The Periphery of FA
 

S. Li
Spansion Inc
Sunnyvale, CA
Microscopy
 

View Program Details and Presentation Times