 |
The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM |
|
The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM |
| Sunday, November 15, 2009 | ||
| 8:00 AM-8:10 AM | ||
| Tutorial Welcome | ||
| 8:15 AM-4:30 PM | ||
| Technology-Specific FA | ||
| 8:30 AM-4:45 PM | ||
| Fault Isolation | ||
| 10:30 AM-4:45 PM | ||
| Die and Defect Access | ||
| Monday, November 16, 2009 | ||
| 8:00 AM-12:00 PM | ||
| Fault Isolation | ||
| 8:00 AM-2:15 PM | ||
| Technology-Specific FA | ||
| 8:15 AM-5:00 PM | ||
| Microscopy | ||
| 1:45 PM-3:15 PM | ||
| The Periphery of FA | ||
| 2:15 PM-4:30 PM | ||
| Lab Management | ||
| 3:30 PM-5:45 PM | ||
| FIB | ||
| 4:30 PM-5:30 PM | ||
| The Periphery of FA | ||