The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM
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Technology-Specific FA
Location: Meeting Room J2 (San Jose McEnery Convention Center)
(Please check final room assignments on-site).
Session Description: Failure analysts share a common toolset and common techniques. Some individual technologies, however, have developed techniques that take advantage of the unique structure or materials of the techology. In this session, we discuss photovoltaics, MEMS, analog circuits and new process technologies.

Session Chairs:Mr. Dan J. Bodoh Freescale Semiconductor, Austin, TX
Mr. Jeremy A. Walraven Sandia National Labs, Albuquerque, NM
8:15 AM Photovoltaic Systems: How Do They Work, and How Do They Fail?
10:15 AM Break
10:30 AM Introduction to MEMS: Materials and Fabrication Processes
11:45 AM Lunch
12:45 PM Optoelectronic Methodologies for Characterization of MEMS and Electronic Packaging
2:00 PM Diagnosing Analog Circuits
3:00 PM Break
3:15 PM Emerging Trends in Failure Modes of Nanotechnology