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The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM |
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| The Periphery of FA | ||||
| Location: J1/J4 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: Failure analysis does not live in a vacuum. The Periphery of FA track looks at test and yield analysis, which both feed into failure analysis. | ||||
| Session Chair: | Dr. Sam Subramanian Freescale Semiconductor, Inc., Austin, TX | |||
| 1:45 PM | Everything (DFT) Testing in 90 Minutes | |||