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The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM |
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| FIB | ||||
| Location: J1/J4 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: Within the last two decades, the focused ion beam machine has become a jack-of-all-trades in the failure analysis lab. The FIB Track is dedicated to the multiple uses of this tool. | ||||
| Session Chair: | Mr. Kultaransingh (Bobby) Hooghan FEI KAUST, Saudi Arabia | |||
| 3:30 PM | Focused Ion Beam – A Design Repair/Fault Isolation Tool | |||
| 5:15 PM | Focused Ion Beam – A Sample Preparation Tool | |||