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The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM |
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| Fault Isolation | ||||
| Location: J1/J4 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: The haystacks are taller, and the needles are smaller. Before any understanding of a root cause can start, the failure analyst must first find the location of the defect on a failing chip. The Fault Localization Track focuses on both imaging and software techniques that can pinpoint a defective location on the failing chip. | ||||
| Session Chair: | Mr. Dan J. Bodoh Freescale Semiconductor, Austin, TX | |||
| 8:00 AM | Photonic Localization Techniques | |||
| 9:30 AM | FA Case Histories Using ATPG and Scan Diagnostics | |||
| 10:30 AM | Break | |||
| 10:45 AM | A Practical Guide to using Scan Diagnosis for FA | |||