The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM
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Technology-Specific FA
Location: Meeting Room J2 (San Jose McEnery Convention Center)
(Please check final room assignments on-site).
Session Description: Failure analysts share a common toolset and common techniques. Some individual technologies, however, have developed techniques that take advantage of the unique structure or materials of the techology. In this session, we discuss memory technologies and atomic force probing.

Session Chair:Mr. Richard Ross Independent, VT
8:00 AM Failure Analysis of SRAM Memory
9:30 AM The Pivotal Role of AFP Nanoscale Failure Analysis
10:30 AM Break
11:00 AM Failure Analysis of Present and Future DRAM Devices
12:00 PM Lunch
1:15 PM Flash Memory Failure Analysis