Session: User's Group 4: Fast ASIC Fault Isolation: Efficiency and Accurate Resolution of Software Based Fault Isolation

The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM

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User's Group 4: Fast ASIC Fault Isolation: Efficiency and Accurate Resolution of Software Based Fault Isolation
Location: Meeting Room J3 (San Jose McEnery Convention Center)
(Please check final room assignments on-site).
Session Description: FA of ASICs can be particularly challenging due to a number of factors. These include: IP content, poor design-for-FA support (particularly for mixed-signal designs), unusual packages, high power dissipation, ATE’s that don’t support software-based diagnosis, difficult test pattern development etc.