The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM

Symposium

Tuesday, November 17, 2009
8:00 AM-10:00 AM
Symposium Opening/Awards Presentation/Keynote Speaker/IPFA 2009 Best Paper Award/TCP Introduction
10:00 AM-12:05 PM
Session 1: Emerging Concepts
1:30 PM-3:35 PM
Session 2: Photon Beam Based Techniques - 1
Session 3: Nanoprobing
4:00 PM-6:00 PM
User's Group 1: Optical Techniques - "Growth and Limitations"
User's Group 2: Resolution of Nanoprobing
Wednesday, November 18, 2009
8:00 AM-9:40 AM
Session 4: Circuit-Edit
Session 5: Sample Preparation
10:00 AM-11:40 AM
Session 6: Alternative Energy
12:05 PM-1:30 PM
EDFAS General Membership Meeting/Networking Luncheon
1:30 PM-2:30 PM
Expo Only Hour
2:30 PM-4:00 PM
Session 7: Posters
4:00 PM-6:00 PM
User's Group 3: FIB
User's Group 4: Fast ASIC Fault Isolation: Efficiency and Accurate Resolution of Software Based Fault Isolation
6:00 PM-8:00 PM
Panel Discussion: FA Career Roadmap and Networking Event
Thursday, November 19, 2009
8:00 AM-9:40 AM
Session 8: Photon Beam Based Techniques - 2
8:00 AM-10:05 AM
Session 9: Package and Assembly Level FA
10:15 AM-11:30 AM
Session 10: Failure Analysis Process
Session 11: Advanced Metrology and System Level FA