A. Falk
OptoMetrix, Inc
Renton, WA
Session 8: Photon Beam Based Techniques - 2
 

A. Mulay
Texas Instruments
TX
Session 11: Advanced Metrology and System Level FA
 

B. Holdford
Texas Instruments
Dallas, TX
Session 5: Sample Preparation
 

C. Boit
TUB Berlin Institute of Technology
Berlin, Germany
Session 6: Alternative Energy
 

D. J. Bodoh
Freescale Semiconductor
Austin, TX
Session 1: Emerging Concepts
 

D. Burgess
Accelerated Analysis
Half Moon Bay, CA
Session 11: Advanced Metrology and System Level FA
 

F. Beaudoin
IBM

Session 2: Photon Beam Based Techniques - 1
 

J. J. Demarest
IBM
Albany, NY
Session 11: Advanced Metrology and System Level FA
 

J. Demarest
IBM
Poughkeepsie, NY
Session 9: Package and Assembly Level FA
 

J. Colvin
FA Instruments
San Jose, CA
Session 10: Failure Analysis Process
 

K. S. Wills
Independent Consultant
Sugar Land, TX
Session 10: Posters
Session 7: Posters
 

M. Bruce
Independent Consultant

Session 1: Emerging Concepts
 

P. Harris
Multiprobe, Inc
Santa Barbara, CA
Session 3: Nanoprobing
 

P. Perdu
CNES - French Space Agency
Toulouse, France
Session 2: Photon Beam Based Techniques - 1
 

R. Champaign
Raytheon

Session 5: Sample Preparation
 

R. Ross
Freescale Semiconductor
Crolles, France
Session 4: Circuit-Edit
 

S. Subramanian
Freescale Semiconductor, Inc.
Austin, TX
In-line Metrology and Inspection
Session 11: Advanced Metrology and System Level FA
 

S. B. Ippolito
IBM
Hopewell Junction, NY
Session 8: Photon Beam Based Techniques - 2
 

T. Cavanah
DCG Systems, Inc
TX
Session 3: Nanoprobing
 

T. Lundquist
DCG Systems
Fremont, CA
Session 4: Circuit-Edit