35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Analysis of poly-Si thin film solar cells by IR-LBIC

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Analysis of poly-Si thin film solar cells by IR-LBIC

Wednesday, November 18, 2009: 10:25 AM
Meeting Room J1-J2 (San Jose McEnery Convention Center)
Mr. Mahyar Boostandoost , Technische Universität Berlin, Berlin, Germany
Lin Hao-Peng , Technische Universität Berlin, Berlin, Germany
Uwe Kerst , Technische Universität Berlin, Berlin, Germany
Christian Boit , Technische Universität Berlin, Berlin, Germany
Dr. Stefan Gall , Berlin Helmholtz Center, Berlin, Germany
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