35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Symposium

Symposium

Tuesday, November 17, 2009

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8:00 AM-10:00 AM

Symposium Opening/Awards Presentation/Keynote Speaker/IPFA 2009 Best Paper Award/TCP Introduction

10:00 AM-12:05 PM

Session 1: Emerging Concepts
Session Chair: Mr. Dan Bodoh and Mike Bruce

1:30 PM-3:35 PM

Session 2: Photon Beam Based Techniques - 1
Session Chair: Felix Beaudoin and Dr. Philippe Perdu

Session 3: Nanoprobing
Session Chair: Mr. Taylor Cavanah and Dr. Peter Harris

4:00 PM-6:00 PM

User's Group 1: Optical Techniques - "Growth and Limitations"

User's Group 2: Resolution of Nanoprobing

Wednesday, November 18, 2009

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8:00 AM-9:40 AM

Session 4: Circuit-Edit
Session Chair: Mr. Ted Lundquist and Ryan Ross

Session 5: Sample Preparation
Session Chair: Ms. Becky Holdford and Robert Champaign

10:00 AM-11:40 AM

Session 6: Alternative Energy
Session Chair: Prof. Christian Boit

12:05 PM-1:30 PM

EDFAS General Membership Meeting/Networking Luncheon

1:30 PM-2:30 PM

2:30 PM-4:00 PM

Session 7: Posters
Session Chair: Mr. Kendall Scott Wills

4:00 PM-6:00 PM

User's Group 3: FIB

User's Group 4: Fast ASIC Fault Isolation: Efficiency and Accurate Resolution of Software Based Fault Isolation

6:00 PM-8:00 PM

Panel Discussion: FA Career Roadmap and Networking Event

Thursday, November 19, 2009

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8:00 AM-9:40 AM

Session 8: Photon Beam Based Techniques - 2
Session Chair: Dr. Stephen Bradley Ippolito and Dr. Aaron Falk

8:00 AM-10:05 AM

Session 9: Package and Assembly Level FA
Session Chair: Mr. James Demarest

10:15 AM-11:30 AM

Session 10: Failure Analysis Process
Session Chair: Mr. Jim Colvin

Session 11: Advanced Metrology and System Level FA
Session Chair: Mr. Apek Mulay, Mr. David Burgess, Dr. James J. Demarest and Dr. Sam Subramanian