35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): User's Group 4: Fast ASIC Fault Isolation: Efficiency and Accurate Resolution of Software Based Fault Isolation

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User's Group 4: Fast ASIC Fault Isolation: Efficiency and Accurate Resolution of Software Based Fault Isolation

Wednesday, November 18, 2009: 4:00 PM-6:00 PM
Meeting Room J3 (San Jose McEnery Convention Center)
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