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Tuesday, November 16, 2010 - 10:00 AM
1.1

Laser Voltage Imaging: A New Perspective of Laser Voltage Probing

D. Skvortsov, Y. S. Ng, T. R. Lundquist, DCG Systems, Inc, Fremont, CA; J. Liao, S. Kasapi, H. L. Marks, NVIDIA, Santa Clara, CA

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Summary: We present LVI as an emerging FA technique. We will discuss setting up an LVI acquisition and present its current challenges. Finally, we will present several LVI applications and supporting case studies.