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Symposium

Tuesday, November 16, 2010
8:00 AM-9:40 AM
Symposium Opening/Awards Presentation/Keynote Speaker/IPFA 2010 Best Paper Award/TCP Introduction
10:00 AM-12:05 PM
1 Session 1: Emerging FA Techniques and Concepts
1:20 PM-2:35 PM
2 Session 3: Packaging and Assembly Level FA I
1:20 PM-3:50 PM
3 Session 2: FA Process/Case Studies
2:35 PM-3:50 PM
4 Session 4: Sample Preparation for Technological Analysis
4:05 PM-5:20 PM
5 Session 5: Defect Characterization & Metrology - I
6 Session 6: Sample Prep for Chip Access and Device Deprocessing
5:20 PM-7:00 PM
User's Group 1: SEM
User's Group 2: Sample Preparation
Wednesday, November 17, 2010
8:00 AM-9:40 AM
7 Session 7: Alternative Energy (Photovoltaics, Solid State Lighting, etc.)
8:00 AM-10:05 AM
8 Session 8: Sample Prep for Chip Access and Device Deprocessing 2
10:20 AM-11:35 AM
9 Session 9: Board and System Level FA
10:20 AM-12:00 PM
10 Session 10: Photon Based Techniques I
12:00 PM-1:10 PM
EDFAS General Membership Meeting & Networking Luncheon
1:10 PM-2:10 PM
Expo Only Hour
2:10 PM-3:10 PM
11 Session 11: Posters
3:10 PM-4:50 PM
12 Session 13: Defect Characterization & Metrology - II
3:10 PM-5:15 PM
13 Session 12: MEMS, Discretes and Optoelectronic Device FA
4:50 PM-6:30 PM
14 Session 14: Test and Diagnostic, Test and Debug
5:15 PM-6:05 PM
15 Session 15: Cicuit Edit I
Thursday, November 18, 2010
8:00 AM-9:40 AM
16 Session 16: Counterfeit Electronics – Risks and Mitigation
9:40 AM-10:35 AM
Panel Discussion
10:50 AM-12:55 PM
17 Session 17: Photon Based Techniques II
18 Session 18: Nanoprobing and Nano Scale Electronic Characterization
1:55 PM-3:10 PM
19 Session 19: Circuit Edit II (Laser, FIB, etc.)
1:55 PM-3:35 PM
User's Group 4: Nanoprobing
3:10 PM-4:50 PM
User's Group 3: FIB
3:35 PM-4:50 PM
20 Session 20: Packaging and Assembly Level FA II