K. Serrels, D. T. Reid, Heriot-Watt University, Edinburgh, United Kingdom; T. R. Lundquist, P. Vedagarbha, DCG Systems, Inc, Freemont, CA

Summary: By inducing two-photon absorption within the device layer of a proprietary silicon test chip, the first nonlinear variant of X-variation mapping is reported by demonstrating frequency mapping of a ring oscillator circuit at 1.55µm