C. Burmer, Infineon, Munich, Germany; F. Hopsch, W. Vermeiren, Fraunhofer IIS/EAS, Dresden, Germany

Summary: In this paper, we describe a fault localization strategy for scan designs based on Time Resolved photon Emission (TRE) and analog simulation. After characterizing the defect’s electrical footprint using TRE, analog fault simulation is applied. A user - friendly software package with an easy to use interface to scan diagnosis, layout tool and simulator was created.