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Wednesday, November 17, 2010 - 8:25 AM
7.1
Photoluminescence and EBIC for Process Control and Failure Analysis in Si-Based Photovoltaics
M. Kittler, T. Arguirov, T. Mchedlidze, R. Schmid, W. Seifert, University Cottbus, Cottbus, Germany
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Summary:
SEM-EBIC allows to image extended crystal defects
