ISTFA Home   •   Exposition   •   To Register   •   ASM Homepage
Back to "Die and Defect Access" Search
  Back to "Tutorial" Search  Back to Main Search

Monday, November 15, 2010 - 2:30 PM

Delayering Techniques

D. Rusli, D. Davis, Texas Instruments Inc., Stafford, TX

The purpose of this tutorial is to present various delayering techniques required to deconstruct semiconductor devices built with state of the art silicon processing technologies. Many of the techniques discussed with appropriate modifications will be transferable to other technologies. The user will be left to decide when and how to use apply the techniques discussed.