This tutorial covers materials analysis techniques including energy dispersive x-ray spectroscopy (EDX), Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), Rutherford backscattering spectrometry (RBS), total x-ray reflection fluorescence (TXRF), and Fourier transform infra-red spectroscopy (FTIR). The new silicon drift detector technology for EDX will be discussed.