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| Microscopy | ||||
| Location: Lalique II (InterContinental Hotel Dallas) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: A picture of the defect remains the goal for most failure analysis. A successful analyst knows how to make the right picture, and how to interpret the picture. In the Microscopy Track, we will discuss the theory and applications of optical, atomic and electron microscopy. | ||||
| Session Chair: | Mr. Kultaransingh (Bobby) Hooghan FEI KAUST, Saudi Arabia | |||
| 8:00 AM | Optical and Infrared FA Microscopy | |||
| 9:15 AM | The Role of the AFM in Yield and FA | |||
| 10:15 AM | Refreshment Break | |||
| 10:30 AM | Scanning Electron Microscopy | |||
| 11:45 AM | Break | |||
| 12:00 PM | Lunch | |||
| 1:00 PM | Ultra-High Resolution in the SEM | |||
| 2:00 PM | Break | |||
| 2:15 PM | Refreshment Break | |||
| 2:30 PM | Transmission Electron Microscopy (TEM) | |||
| 4:00 PM | Materials Characterization for Failure Analysis | |||