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Monday, November 15, 2010 - 8:00 AM

Optical and Infrared FA Microscopy

J. J. McDonald, Quantum Focus Instruments Corporation, Vista, CA

An instrument designer discusses the design, use, and limitations for optics based failure analysis tools for circuits, with added emphasis on infrared microscopy. We begin with fundamental principles governing all microscopes and progress to exotic microscopes in the FA lab including polarized microscopes for liquid crystal hot spots, laser-based microscopes, infrared and ultraviolet microscopes.