V. Ravikumar, M. Y. Ho, S. L. Phoa, V. Narang, J. M. Chin, Advanced Micro Devices - Singapore Pte Ltd1, Singapore, Singapore; R. R. Goruganthu, Advanced Micro Devices Inc., Austin, TX

Summary: Abstract - This paper uses an interesting case study to highlight high-resolution pulsed thermal-induced voltage alteration (TIVA) with solid immersion lens (SIL) as a technique to isolate a temperature-sensitive failure in mixed-signal circuitry, followed by circuit analysis and nanoprobing to confirm a drive strength issue caused by a process change.