Dr. Ulrike Kindereit
Dr. Ulrike Kindereit
IBM T.J. Watson Research Center
Circuit Test and Diagnostics Technology
1101 Kitchawan Road
P.O. Box 218
Yorktown Heights,
NY
USA
10598
Papers:
1.2
A Superconducting Nanowire Single-Photon Detector (SnSPD) System for Ultra Low Voltage Time-Resolved Emission (TRE) Measurements of Vlsi Circuits