39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013): At-A-Glance
39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013): At-A-Glance
SUNDAY November 3
Tutorial
AM
-
Electrical and Yield8:00 AM-12:15 PM
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Package and Physical FA8:00 AM-1:15 PM
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Microscopy10:15 AM-4:15 PM
PM
-
Fault Localization1:15 PM-6:30 PM
-
Technology Specific FA1:15 PM-6:30 PM
MONDAY November 4
Symposium
AM
-
Technical Program Opening8:00 AM-9:45 AM
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Session 1: Emerging Concepts and Techniques10:00 AM-12:05 PM
PM
-
Session 2: 3D Packages1:05 PM-2:45 PM
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Session 3: Test and Diagnostics1:05 PM-2:45 PM
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Session 4: Circuit Edit3:00 PM-4:15 PM
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Session 10: Posters7:00 PM-9:30 PM
Tutorial
PM
-
Green Energy3:00 PM-4:00 PM
TUESDAY November 5
Symposium
AM
-
Late Breaking News8:15 AM-9:15 AM
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Session 6: Packaging and Assembly Analysis - 19:30 AM-11:35 AM
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Session 5: Case Studies and the Failure Analysis Process9:30 AM-4:15 PM
PM
-
Session 7: Defect Characterization and Metrology1:05 PM-4:15 PM
-
Contactless Fault Isolation User Group6:00 PM-8:00 PM
Tutorial
AM
-
FIB8:00 AM-9:00 AM
-
Fault Localization8:00 AM-9:00 AM
WEDNESDAY November 6
Symposium
AM
-
Session 8: Sample Preparation and Device Deprocessing - 19:00 AM-4:20 PM
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Session 9: Photon Based Techniques - 19:00 AM-5:10 PM
PM
-
Session 10: Posters1:30 PM-3:30 PM
-
FIB User Group4:45 PM-6:45 PM
-
Sample Prep / 3D Package User Group5:30 PM-7:30 PM
Tutorial
AM
-
Fault Localization8:00 AM-9:00 AM
-
Package and Physical FA8:00 AM-9:00 AM
THURSDAY November 7
Symposium
AM
-
Session 12: Photon Based Techniques - 210:05 AM-11:45 AM
PM
-
Session 13: Sample Preparation and Device Deprocessing - 21:05 PM-2:20 PM
-
Session 14: Packaging and Assembly Analysis - 23:00 PM-4:15 PM
-
Nanoprobing User Group4:30 PM-6:30 PM
Tutorial
AM
-
Electrical and Yield8:00 AM-9:00 AM
-
Fault Localization8:00 AM-9:00 AM