39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Dr. Carroll Casteel

Materials Science Engineer
ON Semiconductor
Product Engineering
5005 East McDowell Road
Phoenix, AZ
USA 85008

Papers:
7.1 Surface Microstructure Evolution Upon Silicidation of Ni(Pt) and the Different Responses to Metal Etch