Mr. Chunlei Wu

Failure Analysis Engineer
Freescale Semiconductor (China) Limited
Product Analysis Laboratory
No.15 Xinghua Avenue, Xiqing Economic Development Area, Tianjin, China 300385
Tianjin China 300385

Papers:
9.8 Realizing Dynamic Thermal Laser Stimulation By Lock-in IR-Obirch Assisted With a Current Detection Probe Head