39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Alejandro Pimentel

Sandia National Laboratories
Microsystem Validation and Failure Analysis Department
PO Box 5800
Albuquerque, NM
USA 87185

Papers:
12.4 Novel Defect Detection Using Laser-Based Imaging and TIVA With a Visible Laser