39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Mr. Taehong Ha

Senior Engineer
Samsung electronics Co. Ltd
Yield Enhancement
San #16, Banwol-Dong
Hwasung South Korea 445-701

Papers:
10.14 A Reduction of Off-Leakage Current of SWD (Sub-WordLine Driver) Pmosfet for Nwl-Based Mobile DRAM