39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Kannan Sekar

Globalfoundries Inc.
Technology Development
400 Stonebreak Road Ext.
Malta, NY
USA 12020

Papers:
3.4 Leveraging Root Cause Deconvolution Analysis for Logic Yield Ramping 5.2 Open Failure Diagnosis Candidate Selection Based On Passive Voltage Contrast Potential and Processing Cost