Christian Baks

IBM Research
1101 Kitchawan Road
PB Box 218
Yorktown Heights, NY
USA 10598

Papers:
1.2 A Superconducting Nanowire Single-Photon Detector (SnSPD) System for Ultra Low Voltage Time-Resolved Emission (TRE) Measurements of Vlsi Circuits 9.6 Tester-Based Methods to Enhance Spatial Resolvability and Interpretation of Time-Integrated and Time-Resolved Emission Measurements