Mr. Yuri Sylvester
Mr. Yuri Sylvester
Semiconductor Technologist
Carl Zeiss X-ray Microscopy
Applications Engineering
4385 Hopyard Rd, Suite 100
Pleasanton,
CA
USA
94588
Papers:
Non-Destructive 3D X-Ray Microscopy to Complement Physical Cross-Section in the Failure Analysis and Package Development Workflows