45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

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Mr. Jürgen Gluch

Dr.-Ing.
Fraunhofer IKTS
Dresden Germany 01109

Papers:

Optimisation of large chunk lift-out method and lamella preparation for CBED measurements using Xenon Plasma FIB

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General Information

November 10 - 14, 2019


Portland, OR