45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019
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Prof. Ehrenfried Zschech
Dr.
Fraunhofer IKTS
Dresden Germany 01109
Papers:
Optimisation of large chunk lift-out method and lamella preparation for CBED measurements using Xenon Plasma FIB
