45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. Tomáš Morávek
TESCAN Brno
Brno Czech Republic 62300
Papers:
Optimisation of large chunk lift-out method and lamella preparation for CBED measurements using Xenon Plasma FIB