45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

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Dr. Changqing Chen

Deputy Director
Globalfoundries
QRA
Singapore Singapore 738406

Papers:

Application of Nanoprobing on the subtle defect in the embedded non-volatile memory device
Failure Analysis on Inter Polysilicon Oxide Reliability Issues of 40nm Automotive NVM Device

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General Information

November 10 - 14, 2019


Portland, OR