Cutting-edge sample preparation from FIB to concentrated ion beam argon milling of advanced semiconductor devices

Wednesday, December 9, 2020: 12:05 PM
Dr. Cecile S. Bonifacio , E.A. Fischione Instruments, Inc., Export, PA
Dr. Pawel Nowakowski , E.A. Fischione Instruments, Inc., Export, PA
Mr. Richard Li , E.A. Fischione Instruments, Inc., Export, PA
Dr. Clive Downing , Trinity College Dublin, Dublin, Ireland
Ms. Mary Ray , E.A. Fischione Instruments, Inc., Export, PA
Mr. Paul Fischione , E.A. Fischione Instruments, Inc., Export, PA

See more of: FIB Sample Preparation I
See more of: EDFAS Virtual Workshop